High-resolution MFM: Simulation of tip sharpening
نویسندگان
چکیده
منابع مشابه
Customized MFM probes with high lateral resolution
Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a conve...
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ژورنال
عنوان ژورنال: IEEE Transactions on Magnetics
سال: 2003
ISSN: 0018-9464
DOI: 10.1109/tmag.2003.816178